INITIALIZATION STATE DETERMINATION OF A MAGNETIC MULTI-TURN SENSOR

The disclosure relates to a method of determining the initialization state of a multi-turn sensor based on the sensor outputs. The method takes a reading of the sensor outputs, and then determines whether the sensor outputs are feasible based on an assumption that the sensor is initialized in one of...

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Bibliographische Detailangaben
Hauptverfasser:	Tonge, Peter James, Mueller-Aulmann, Michael, Dutt, Monsoon
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MANUFACTURE OR TREATMENT OF NANOSTRUCTURES MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR NANOTECHNOLOGY PERFORMING OPERATIONS PHYSICS SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES TARIFF METERING APPARATUS TESTING TRANSPORTING
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Beschreibung
Zusammenfassung:	The disclosure relates to a method of determining the initialization state of a multi-turn sensor based on the sensor outputs. The method takes a reading of the sensor outputs, and then determines whether the sensor outputs are feasible based on an assumption that the sensor is initialized in one of two states. If the sensor outputs are correct, this initial assumption is taken to also be correct. However, if an incorrect sensor output is read, then it is taken that the assumed initialization state is incorrect. The sensor is therefore taken to be initialized in the alternative state. The method will then determine whether the sensor outputs are feasible based on this second assumption, and if an incorrect sensor output is still being read, then there is a fault in the multi-turn sensor.