IMAGE ANALYSIS APPARATUS, IMAGE ANALYSIS METHOD, AND PROGRAM

Provided are an image analysis apparatus, an image analysis method, and a program that can reduce erroneous detection of defective portions. An image analysis apparatus includes a processor. The processor is configured to acquire an infrared thermal image that is a captured image of a structure to be inspected, acquire a visible image that is a captured image of the structure to be inspected, determine a temperature defect from the infrared thermal image, and estimate a cause of the temperature defect on the basis of, for the temperature defect, at least temperature defect information obtained from the infrared thermal image, and surface defect information obtained from the visible image.