AUTOMATICALLY DETECTING SYSTEM WITH MICROSCOPE AND METHOD THEREOF

An automatically detecting system with microscope includes a platform and a gripper. The platform has a carrying area, a fixed block, a movable block, and an elastic member. The carrying area is formed at the platform, the fixed block and the movable block are configured at opposite sides of the car...

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1. Verfasser: CHANG, YENIEH
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:An automatically detecting system with microscope includes a platform and a gripper. The platform has a carrying area, a fixed block, a movable block, and an elastic member. The carrying area is formed at the platform, the fixed block and the movable block are configured at opposite sides of the carrying area, and the elastic member is connected to the movable block. The gripper pushes the movable block through an inclined plane of the movable block when moving a slide to the carrying area. When the gripper puts the slide on the carrying area, the movable block and the fixed block hold the slide with the elastic restoring force of the elastic member, and the gripper closes and moves on the upper surface of the slide to flatten the slide. Therefore, the slide can be set on the platform stably and flatly to obtain the focal length precisely and rapidly.