APPARATUS AND METHOD FOR MEASURING AN EMBEDDED OBJECT

The present disclosure generally relates to an apparatus (100) and method for measuring an object (200) embedded in a structure (210). The apparatus (100) comprises: a first antenna (110a) and a second antenna (110b) with respective perpendicular and parallel polarizations; a measurement instrument...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Sun, Haihan, Fan, Zheng
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present disclosure generally relates to an apparatus (100) and method for measuring an object (200) embedded in a structure (210). The apparatus (100) comprises: a first antenna (110a) and a second antenna (110b) with respective perpendicular and parallel polarizations; a measurement instrument (120); and a control system (130). The measurement instrument (120) transmits and measures radio signals reflected from the object (200). The control system (130) generates a first representation (250) and a second representation (260) of the object (200) based on the measured radio signals from the first antenna (110a) and second antenna (110b), respectively. The control system (130) then measures a size of the object (200) from the first and second representations (250,260).