HIGH-PRECISION SUBSTRATE POLISHING SYSTEM

Provided is a high-precision substrate polishing system. An apparatus for polishing a substrate includes a platen on which a polishing pad is seated and which is rotatable, a substrate carrier configured to grip a substrate and rotatable on an upper side of the platen, an infrared sensor located ins...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WOO, Sang Jeong, YANG, Ki Hyuk
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Provided is a high-precision substrate polishing system. An apparatus for polishing a substrate includes a platen on which a polishing pad is seated and which is rotatable, a substrate carrier configured to grip a substrate and rotatable on an upper side of the platen, an infrared sensor located inside the platen and configured to measure a temperature of the substrate, and a controller configured to determine a polishing state of the substrate using a value measured by the infrared sensor.