SYSTEMS AND METHODS FOR OPTIMIZING A MACHINE LEARNING MODEL BASED ON A PARITY METRIC

Techniques for optimizing a machine learning model. The techniques may include obtaining multiple predictions from a machine learning model, the predictions being based on at least one input feature vector, each input feature vector having one or more vector values; creating at least one slice of th...

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Hauptverfasser: MIYARA, Reah, BEHAILU, Tsion, LOPATECKI, Jason, DHINAKARAN, Aparna
Format: Patent
Sprache:eng
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Zusammenfassung:Techniques for optimizing a machine learning model. The techniques may include obtaining multiple predictions from a machine learning model, the predictions being based on at least one input feature vector, each input feature vector having one or more vector values; creating at least one slice of the predictions based on at least one vector value; determining a sensitive bias metric for the slice based on a sensitive group; determining a base metric for the slice based on a base group; determining a parity metric for the slice based on a ratio of the sensitive bias metric and the base metric; and optimizing the machine learning model based on the parity metric.