INSPECTION DEVICE, METHOD, AND COMPUTER PROGRAM FOR INSPECTION

An inspection device includes a processor configured to calculate a first identification index indicating likelihood of each possible state of an object to be inspected regarding a predetermined inspection item by inputting a color image representing the object into a first classifier, the color ima...

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Bibliographische Detailangaben
Hauptverfasser:	Naitou, Takahiko, Nakamukai, Yasunori, Arita, Kazuhiro, Tomita, Yukiharu, Ito, Akihito
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS
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Beschreibung
Zusammenfassung:	An inspection device includes a processor configured to calculate a first identification index indicating likelihood of each possible state of an object to be inspected regarding a predetermined inspection item by inputting a color image representing the object into a first classifier, the color image being generated by a camera, calculate a second identification index indicating likelihood of each possible state of the object regarding the predetermined inspection item by inputting a depth image representing, for each pixel, the distance to a part of the object represented in the pixel into a second classifier, the depth image being generated by a 3-D camera, and determine the state of the object regarding the inspection item, based on the result of integration of the first identification index and the second identification index.