Event-Based Machine Learning for a Time-Series Metric

A method for generating samples for an anomaly detection system includes receiving events that occurred during a time series of a target metric. Each respective event includes an event attribute characterizing the respective event. The method includes generating a set of event groups for the events. Each event shares a respective attribute with one or more other events of the respective event group. For each respective event group of the set of event groups, the method includes determining an influence pattern that identifies an influence of the respective event group on the target metric. The method includes clustering the set of event groups into event clusters based on a respective influence pattern of each respective event group. Each event cluster includes one or more event groups that share a similar influence pattern. The method includes generating training samples for an anomaly detection system based on a respective event cluster.