INSPECTION DEVICE
An inspection device includes: a light source for outputting pulsed excitation light with a time width of 10 picoseconds to 10 nanoseconds; a nonlinear optical crystal for generating a terahertz wave by optical wavelength conversion of the pulsed excitation light; a polarization part for reflecting...
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| creator | Kamino, Yuichiro Minamide, Hiroaki Yamamoto, Syusaku Nawata, Koji Kajikawa, Keisuke |
| description | An inspection device includes: a light source for outputting pulsed excitation light with a time width of 10 picoseconds to 10 nanoseconds; a nonlinear optical crystal for generating a terahertz wave by optical wavelength conversion of the pulsed excitation light; a polarization part for reflecting at least a part of a reflected wave of the terahertz wave reflected by an inspection target; and a detector for detecting the reflected wave reflected by the polarization part. |
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a nonlinear optical crystal for generating a terahertz wave by optical wavelength conversion of the pulsed excitation light; a polarization part for reflecting at least a part of a reflected wave of the terahertz wave reflected by an inspection target; and a detector for detecting the reflected wave reflected by the polarization part.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; DEVICES USING STIMULATED EMISSION ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230914&DB=EPODOC&CC=US&NR=2023288327A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230914&DB=EPODOC&CC=US&NR=2023288327A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Kamino, Yuichiro</creatorcontrib><creatorcontrib>Minamide, Hiroaki</creatorcontrib><creatorcontrib>Yamamoto, Syusaku</creatorcontrib><creatorcontrib>Nawata, Koji</creatorcontrib><creatorcontrib>Kajikawa, Keisuke</creatorcontrib><title>INSPECTION DEVICE</title><description>An inspection device includes: a light source for outputting pulsed excitation light with a time width of 10 picoseconds to 10 nanoseconds; 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| subjects | BASIC ELECTRIC ELEMENTS DEVICES USING STIMULATED EMISSION ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | INSPECTION DEVICE |
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