ION BEAM EXCLUSION PATHS ON THE TARGET SURFACE TO OPTIMIZE NEUTRON BEAM PERFORMANCE

Embodiments of systems, devices, and methods relate to exclusion of ion beam paths on the target surface to optimize neutron beam performance. A particle beam is directed along an axis so that the particle beam is incident on a target positioned on the particle beam axis. The target has a scannable...

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Bibliographische Detailangaben
Hauptverfasser: Lee, Charles Leon, Dunaevsky, Alexander, Styron, Jedediah, Eggers, Harrison Beam, Snitchler, Gregory Luke
Format: Patent
Sprache:eng
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Zusammenfassung:Embodiments of systems, devices, and methods relate to exclusion of ion beam paths on the target surface to optimize neutron beam performance. A particle beam is directed along an axis so that the particle beam is incident on a target positioned on the particle beam axis. The target has a scannable surface extending over an area substantially orthogonal to the axis. The particle beam is scanned across the scannable surface of the target along a first path having a first flux. The particle beam, having a second flux, is scanned across the scannable surface of the target along a second path that is within an exclusion area of the target.