MEASUREMENT SYSTEM

The shape of an object is measured with high accuracy.A measurement system includes a frame recognition unit configured to detect one or more frames indicating a straight line portion from a captured image, a depth measurement unit configured to perform depth measurement, and a dimension estimation...

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Bibliographische Detailangaben
Hauptverfasser:	TAKAHASHI, Satoshi, TANABE, Satomi, YANG, Menglong, SHIMIZU, Naoki
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	The shape of an object is measured with high accuracy.A measurement system includes a frame recognition unit configured to detect one or more frames indicating a straight line portion from a captured image, a depth measurement unit configured to perform depth measurement, and a dimension estimation unit configured to calculate a length of a frame on a basis of the captured image and a result of the depth measurement. The measurement system may have a function of specifying a range in which a measurement target object is present from the captured image.