SYSTEMS AND METHODS FOR ANALYZING WORKSPACE CLUTTER AND GENERATING IMPROVED WORKSPACE LAYOUTS

A system for evaluating a workspace surface having one or more objects placed thereon is disclosed. The system may include sensors configured to capture data corresponding to the workspace surface and a controller communicatively coupled to the sensors. The controller may generate an illuminance map...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	YADAV, DAKSHA, KAUR, JASLEEN, MAHDIZADEHAGHDAM, SHAHIN, SAVERA, ARHUM
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING DETECTING MASSES OR OBJECTS GEOPHYSICS GRAVITATIONAL MEASUREMENTS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A system for evaluating a workspace surface having one or more objects placed thereon is disclosed. The system may include sensors configured to capture data corresponding to the workspace surface and a controller communicatively coupled to the sensors. The controller may generate an illuminance map of the workspace surface based on the captured data. The controller may generate a clutter entropy level based on the illuminance map and an entropy assessor. The controller may determine whether the clutter entropy level exceeds a clutter threshold. The controller may provide a clutter indication to a user device if the clutter entropy level exceeds the clutter threshold. The controller may identify the objects placed on the workspace surface. The controller may generate a decluttered layout based on the one or more objects and a layout generator.