IMS ANALYZER
The present disclosure provides an IMS analyzer including an analysis chamber, an electron emitter, an ion detector, a first gas injector that injects a sample gas into the analysis chamber, a second gas injector that injects a drift gas into the analysis chamber, a third gas injector that injects a...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | The present disclosure provides an IMS analyzer including an analysis chamber, an electron emitter, an ion detector, a first gas injector that injects a sample gas into the analysis chamber, a second gas injector that injects a drift gas into the analysis chamber, a third gas injector that injects a primary ion generating gas into the analysis chamber, and an outlet port, in which the first gas injector, the second gas injector, the third gas injector, and the outlet port are arranged such that the sample gas merges with the drift gas and the primary ion generating gas in a reaction area and is discharged through the outlet port, the ion detector is located on an upperstream side of the drift gas stream relative to the reaction area, and the electron emitter is located on an upperstream side of the primary ion generating gas stream relative to the reaction area. |
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