SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

A method includes forming a semiconductor fin over a substrate; forming a gate structure over the semiconductor fin, the gate structure comprising: a first metallic layer; a second metallic layer over the first metallic layer, wherein the first metallic layer is a metal compound of a first element a...

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Bibliographische Detailangaben
Hauptverfasser: TZENG, Ju-Yuan, CHIANG, Hsin-Che, LIANG, Chun-Sheng, YEH, Jeng-Ya David, WANG, Shu-Hui, YEH, Chih-Yang
Format: Patent
Sprache:eng
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Zusammenfassung:A method includes forming a semiconductor fin over a substrate; forming a gate structure over the semiconductor fin, the gate structure comprising: a first metallic layer; a second metallic layer over the first metallic layer, wherein the first metallic layer is a metal compound of a first element and a second element and the second metallic layer is a single-element metal of the second element; and an oxide layer between the first metallic layer and the second metallic layer.