INTEGRATED CIRCUIT WITH OFF-STATE DIAGNOSIS FOR DRIVER CHANNELS
An integrated circuit includes a plurality of power transistor driver channels for driving external loads. The driver channels can be selectively configured as high side or low side driver channels. The integrated circuit includes, for each driver channel, a respective analog test circuit and a resp...
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| creator | ANNOVAZZI, Marzia MAGGIO, Lucia BAGNATI, Gaudenzia ALAGNA, Diego |
| description | An integrated circuit includes a plurality of power transistor driver channels for driving external loads. The driver channels can be selectively configured as high side or low side driver channels. The integrated circuit includes, for each driver channel, a respective analog test circuit and a respective controller. The integrated circuit includes a single counter connected to each of the controllers for simultaneously controlling off-state diagnosis timing windows for the driver channels. |
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The integrated circuit includes a single counter connected to each of the controllers for simultaneously controlling off-state diagnosis timing windows for the driver channels.</description><language>eng</language><subject>BASIC ELECTRONIC CIRCUITRY ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; PULSE TECHNIQUE ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230824&DB=EPODOC&CC=US&NR=2023266381A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230824&DB=EPODOC&CC=US&NR=2023266381A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ANNOVAZZI, Marzia</creatorcontrib><creatorcontrib>MAGGIO, Lucia</creatorcontrib><creatorcontrib>BAGNATI, Gaudenzia</creatorcontrib><creatorcontrib>ALAGNA, Diego</creatorcontrib><title>INTEGRATED CIRCUIT WITH OFF-STATE DIAGNOSIS FOR DRIVER CHANNELS</title><description>An integrated circuit includes a plurality of power transistor driver channels for driving external loads. 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The driver channels can be selectively configured as high side or low side driver channels. The integrated circuit includes, for each driver channel, a respective analog test circuit and a respective controller. The integrated circuit includes a single counter connected to each of the controllers for simultaneously controlling off-state diagnosis timing windows for the driver channels.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRONIC CIRCUITRY ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PULSE TECHNIQUE TESTING |
| title | INTEGRATED CIRCUIT WITH OFF-STATE DIAGNOSIS FOR DRIVER CHANNELS |
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