INTEGRATED CIRCUIT WITH OFF-STATE DIAGNOSIS FOR DRIVER CHANNELS

INTEGRATED CIRCUIT WITH OFF-STATE DIAGNOSIS FOR DRIVER CHANNELS

An integrated circuit includes a plurality of power transistor driver channels for driving external loads. The driver channels can be selectively configured as high side or low side driver channels. The integrated circuit includes, for each driver channel, a respective analog test circuit and a resp...

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Bibliographische Detailangaben
Hauptverfasser: ANNOVAZZI, Marzia, MAGGIO, Lucia, BAGNATI, Gaudenzia, ALAGNA, Diego
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRONIC CIRCUITRY
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
PULSE TECHNIQUE
TESTING
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Beschreibung
Zusammenfassung:An integrated circuit includes a plurality of power transistor driver channels for driving external loads. The driver channels can be selectively configured as high side or low side driver channels. The integrated circuit includes, for each driver channel, a respective analog test circuit and a respective controller. The integrated circuit includes a single counter connected to each of the controllers for simultaneously controlling off-state diagnosis timing windows for the driver channels.