TIME-OF-FLIGHT MEASUREMENT METHOD, APPARATUS, AND SYSTEM

This application discloses a time-of-flight measurement method, apparatus, and system. The method includes obtaining histogram data of a target object. The histogram data includes m counts, m is an integer greater than 1, and each of the m counts is associated with a time. The method also includes p...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: YANG, Jincheng, REN, Yalin
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:This application discloses a time-of-flight measurement method, apparatus, and system. The method includes obtaining histogram data of a target object. The histogram data includes m counts, m is an integer greater than 1, and each of the m counts is associated with a time. The method also includes performing digital filtering on the m counts to obtain m filtered values respectively corresponding to the m counts, and determining a time of flight of the target object based on a time corresponding to a peak value in the m filtered values.