METHOD AND APPARATUS FOR STATIONARY ELECTROMAGNETIC INSPECTION (EMI) WITH ORTHOGONAL MAGNETIZERS

A stationary electromagnetic inspection (EMI) apparatus and method are disclosed which includes a base; a plurality of hydraulic clamping rollers, connected to that base, operable to move a test pipe forward and backward in a translational direction only; a transverse flaw detection module comprisin...

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Bibliographische Detailangaben
Hauptverfasser:	VU, HUNG MINH, LE, SY VAN, NGUYEN, KHUONG NGOC, PHAN, BINH MINH QUOC, TRAN, HUNG QUANG, PHAM, QUANG HONG
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A stationary electromagnetic inspection (EMI) apparatus and method are disclosed which includes a base; a plurality of hydraulic clamping rollers, connected to that base, operable to move a test pipe forward and backward in a translational direction only; a transverse flaw detection module comprising a plurality of sensor arms each equipped with rows of magnetic sensor arrays arranged in a stagger manner along an axis of a test pipe; and a longitudinal flaw detection module comprising magnetizers and magnetic sensor arrays each respectively arranged orthogonal to one another.