CIRCUITS AND TECHNIQUES FOR PREDICTING END OF LIFE BASED ON IN SITU MONITORS AND LIMIT VALUES DEFINED FOR THE IN SITU MONITORS

CIRCUITS AND TECHNIQUES FOR PREDICTING END OF LIFE BASED ON IN SITU MONITORS AND LIMIT VALUES DEFINED FOR THE IN SITU MONITORS

In some examples, a circuit comprises a function unit configured to perform a circuit function, and one or more in situ monitors configured to measure internal data associated with the circuit. The circuit may further comprise a memory configured to store one or more limit values associated with the...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Kleeberger, Veit, Zalman, Rafael, Georgakos, Georg, Zettler, Thomas, Rossmeier, Ludwig, Gstoettenbauer, Bernhard, Hammerschmidt, Dirk
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:In some examples, a circuit comprises a function unit configured to perform a circuit function, and one or more in situ monitors configured to measure internal data associated with the circuit. The circuit may further comprise a memory configured to store one or more limit values associated with the one or more in situ monitors, and a lifetime model unit configured to determine whether the circuit has reached an end-of-life threshold based on the measured internal data from the one or more in situ monitors and the limit values.