Point-Cloud Processing

A processing circuitry of a LIDAR measurement device (101, 102, 103) in a multi-pose fixed-pose measurement setup is disclosed. The circuitry receives a plurality of data points of a point-cloud dataset, each data point of the plurality of data points indicating a respective depth position (601), di...

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Bibliographische Detailangaben
Hauptverfasser: Houshiar, Hamidreza, Wojtech, Rolf
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A processing circuitry of a LIDAR measurement device (101, 102, 103) in a multi-pose fixed-pose measurement setup is disclosed. The circuitry receives a plurality of data points of a point-cloud dataset, each data point of the plurality of data points indicating a respective depth position (601), different data points of the plurality of data points being associated with different lateral positions in a field-of-view (602) of the LIDAR measurement device (101, 102, 103), each lateral position being associated with a respective predefined reference depth threshold. For each data point of the plurality of data points, the circuitry performs a comparison of the depth position (601) indicated by the respective data point with the respective reference depth threshold and selectively discards the data point upon the respective comparison yielding that the depth position (601) indicated by the respective data point substantially equals the respective reference depth threshold. Upon said selectively discarding, the circuitry outputs, to an external interface of the LIDAR measurement device (101, 102, 103) connected to a communications link (108), the point-cloud dataset. Point-cloud datasets (191, 192, 193) can be provided to a server (109). The circuitry facilitates a size reduction of the point-cloud datasets by removing data points from a point-cloud dataset that are associated with a background of a scene which is static with respect to the LIDAR scanner. This facilitates reduced computational resources for subsequent applications. The circuitry also may determine malfunction of the measurement device.