DETECTING SUITABILITY OF MACHINE LEARNING MODELS FOR DATASETS

Apparatuses, systems, program products, and method are disclosed for detecting suitability of machine learning models for datasets. An apparatus includes a training evaluation module configured to calculate a first statistical data signature for a training data set of a machine learning system using...

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Bibliographische Detailangaben

Hauptverfasser:	Talagala, Nisha, Roselli, Drew, Ramsundar, Bharath, Khermosh, Lior, Sundararaman, Swaminathan, Subramanian, Sriram, Amar, Lior, Ghanta, Sindhu, Sridhar, Vinay
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
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