DETECTING SUITABILITY OF MACHINE LEARNING MODELS FOR DATASETS

DETECTING SUITABILITY OF MACHINE LEARNING MODELS FOR DATASETS

Apparatuses, systems, program products, and method are disclosed for detecting suitability of machine learning models for datasets. An apparatus includes a training evaluation module configured to calculate a first statistical data signature for a training data set of a machine learning system using...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Talagala, Nisha, Roselli, Drew, Ramsundar, Bharath, Khermosh, Lior, Sundararaman, Swaminathan, Subramanian, Sriram, Amar, Lior, Ghanta, Sindhu, Sridhar, Vinay
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Beschreibung
Zusammenfassung:Apparatuses, systems, program products, and method are disclosed for detecting suitability of machine learning models for datasets. An apparatus includes a training evaluation module configured to calculate a first statistical data signature for a training data set of a machine learning system using one or more predefined statistical algorithms. An apparatus includes an inference evaluation module configured to calculate a second statistical data signature for an inference data set of a machine learning system using one or more predefined statistical algorithms. An apparatus includes a score module configured to calculate a suitability score describing the suitability of a training data set to an inference data set as a function of a first and a second statistical data signature. An apparatus includes an action module configured to perform an action related to a machine learning system in response to a suitability score satisfying an unsuitability threshold.