SYSTEM AND METHOD FOR IDENTIFYING AND ANALYZING DESIRED PROPERTIES OF A MATERIAL

SYSTEM AND METHOD FOR IDENTIFYING AND ANALYZING DESIRED PROPERTIES OF A MATERIAL

A method including generating a plurality of synthetic images of a material, where each synthetic image from among the plurality of synthetic images is associated with a feasibility value greater than a threshold synthetic feasibility value. The method includes determining, for each synthetic image...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Tardiff, Janice Lisa, Blanchard, Patrick James, Upadhyay, Devesh, Admasu, Alemayehu
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
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Beschreibung
Zusammenfassung:A method including generating a plurality of synthetic images of a material, where each synthetic image from among the plurality of synthetic images is associated with a feasibility value greater than a threshold synthetic feasibility value. The method includes determining, for each synthetic image from among the plurality of synthetic images, one or more material properties of the material and one or more process parameters of the material based on the synthetic image and generating a plurality of data points and a pareto surface based on the one or more material properties and the one or more process parameters. The method includes selecting a target data point based on the plurality of data points and a distance between a set of data points from among the plurality of data points and the pareto surface.