ABNORMALITY ESTIMATION SYSTEM, ABNORMALITY ESTIMATION METHOD, AND PROGRAM

A system for estimating an abnormality includes an industrial device that controls one or more jigs such that the one or more jigs press an object to perform a work process, and processing circuitry that acquires operation data that is related to an operation of the industrial device and is measured...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: GOYA, Masahiro, TOYODA, Kohei
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A system for estimating an abnormality includes an industrial device that controls one or more jigs such that the one or more jigs press an object to perform a work process, and processing circuitry that acquires operation data that is related to an operation of the industrial device and is measured at multiple time points after the object is pressed by the one or more jigs, and perform an estimation estimating an abnormality based on the operation data acquired.