SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS

A method of processing a substrate in which a silicon layer and a silicon germanium layer are alternately stacked one above another, includes: forming an oxide film by selectively oxidizing a surface layer of an exposed surface of the silicon germanium layer using a gas containing fluorine and oxyge...

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Bibliographische Detailangaben
Hauptverfasser: SHIMIZU, Akitaka, TAKAHASHI, Nobuhiro, ASADA, Yasuo
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method of processing a substrate in which a silicon layer and a silicon germanium layer are alternately stacked one above another, includes: forming an oxide film by selectively oxidizing a surface layer of an exposed surface of the silicon germanium layer using a gas containing fluorine and oxygen radicalized with a remote plasma; and removing the oxide film.