INSPECTION APPARATUS AND INSPECTION METHOD FOR DISPLAY DEVICE

An embodiment provides an inspection apparatus for a display device, including: a light supplier that supplies light to a surface of the display device; an inspection pattern portion positioned between the display device and the light supplier; a measurement portion that measures reflected light ref...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	SEOK, Sangjun, KIM, Namhyuk
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	An embodiment provides an inspection apparatus for a display device, including: a light supplier that supplies light to a surface of the display device; an inspection pattern portion positioned between the display device and the light supplier; a measurement portion that measures reflected light reflected from the surface of the display device; and a processor that processes data of the reflected light measured by the measurement portion, wherein the processor includes a calibration data portion including calibration data and a calibrator calibrating the data using the calibration data of the calibration data portion.