PARAMETER SPACE REDUCTION FOR DEVICE TESTING

Described herein are systems, methods, and other techniques for identifying redundant parameters and reducing parameters for testing a device. A set of test values and limits for a set of parameters are received. A set of simulated test values for the set of parameters are determined based on one or...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Nagle, James C, Kizunov, Sergey, Thung, Stephen, Teplinsky, Shaul
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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