PARAMETER SPACE REDUCTION FOR DEVICE TESTING

Described herein are systems, methods, and other techniques for identifying redundant parameters and reducing parameters for testing a device. A set of test values and limits for a set of parameters are received. A set of simulated test values for the set of parameters are determined based on one or...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Nagle, James C, Kizunov, Sergey, Thung, Stephen, Teplinsky, Shaul
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Described herein are systems, methods, and other techniques for identifying redundant parameters and reducing parameters for testing a device. A set of test values and limits for a set of parameters are received. A set of simulated test values for the set of parameters are determined based on one or more probabilistic representations for the set of parameters. The one or more probabilistic representations are constructed based on the set of test values. A set of cumulative probabilities of passing for the set of parameters are calculated based on the set of simulated test values and the limits. A reduced set of parameters are determined from the set of parameters based on the set of cumulative probabilities of passing. The reduced set of parameters are deployed for testing the device.