OUTPUT VOLTAGE GLITCH REDUCTION IN ATE SYSTEMS

OUTPUT VOLTAGE GLITCH REDUCTION IN ATE SYSTEMS

An automated testing system comprises a high side switch circuit coupled to an input/output (I/O) connection, a low side switch circuit coupled to the I/O connection, a high side force amplifier (HFA) coupled to the high side switch, a low side force amplifier (LFA) coupled to the low side switch, a...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Harrell, Michael E, D'Aquino, Stefano I, Turvey, Anthony Eric, Pierdomenico, Jennifer W
Format: Patent
Sprache:eng
Schlagworte:
AMPLIFIERS
BASIC ELECTRONIC CIRCUITRY
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:An automated testing system comprises a high side switch circuit coupled to an input/output (I/O) connection, a low side switch circuit coupled to the I/O connection, a high side force amplifier (HFA) coupled to the high side switch, a low side force amplifier (LFA) coupled to the low side switch, an adjusting circuit coupled to the HFA and the LFA, and a control circuit configured to change the adjusting circuit to change control of current at the I/O connection from one of the HFA or LFA to the other of the HFA or LFA.