MEASUREMENT DEVICE, MEASUREMENT METHOD, AND PROGRAM

A measurement device is provided. The measurement device comprises a guide light source unit, an imaging unit, and a measurement unit. The guide light source unit is configured to output guide light and to continuously irradiate a measurement surface at a plurality of measurement reference points with said guide light. The measurement reference points are each at one end of the distance between two points to the measurement surface. The imaging unit is configured so as to capture a spot of guide light at the measurement surface at a first measurement reference point. The measurement unit is configured to calculate the slope of the measurement surface on the basis of the shape of the captured spot, and to calculate the depth of a second measurement reference point at an instance following the first measurement reference point on the basis of the calculation of the slope.