DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND PROGRAM, AND PRINTING DEVICE AND METHOD OF MANUFACTURING PRINTED MATTER

Provided are a defect inspection device, a defect inspection method, and a program, and a printing device and a method of manufacturing a printed matter, in which a defect of a printed matter is inspected by performing registration between reference data and imaging data of the printed matter printe...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: SEKI, Masaki
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Provided are a defect inspection device, a defect inspection method, and a program, and a printing device and a method of manufacturing a printed matter, in which a defect of a printed matter is inspected by performing registration between reference data and imaging data of the printed matter printed on the basis of the reference data with high accuracy at high speed. The reference data and the imaging data of the printed matter printed on the basis of the reference data by a single-pass type printing device that includes an inkjet head having a plurality of nozzles disposed in a nozzle direction are acquired, registration between the imaging data and the reference data in the nozzle direction is performed by using nozzle mapping information indicating a correspondence relationship between positions of the plurality of nozzles and pixel positions of the imaging data in the nozzle direction, and a defect of the printed matter is inspected in response to an input of the imaging data and the reference data that have been subjected to registration.