System and Methods for Wafer Drying

In one example, a method for wafer drying includes providing a surface of a first wafer, the surface of the first wafer including a liquid to be removed with a drying process. The method further includes replacing the liquid with a first solid film in a first processing chamber, the first solid film...

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Bibliographische Detailangaben
Hauptverfasser: Hurd, Trace, Rotondaro, Antonio Luis Pacheco, Bassett, Derek William, Kosugi, Hitoshi
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:In one example, a method for wafer drying includes providing a surface of a first wafer, the surface of the first wafer including a liquid to be removed with a drying process. The method further includes replacing the liquid with a first solid film in a first processing chamber, the first solid film covering the surface of the first wafer. The method further includes transferring the first wafer from the first processing chamber to a second processing chamber. The method further includes processing the first wafer in the second processing chamber by flowing a supercritical fluid through the second processing chamber, where the supercritical fluid removes the first solid film.