METHOD FOR ESTABLISHING DEFECT DETECTION MODEL AND ELECTRONIC APPARATUS

A method for establishing a defect detection model and an electronic apparatus are provided. A first classification model is established based on a training sample set including a plurality of training samples. The training samples are respectively input to the first classification model to obtain a...

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Bibliographische Detailangaben
Hauptverfasser: Chao, Shih-Yi, Zhang, Jia-Hong
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method for establishing a defect detection model and an electronic apparatus are provided. A first classification model is established based on a training sample set including a plurality of training samples. The training samples are respectively input to the first classification model to obtain a classification result of each training sample. A plurality of outlier samples that are classified incorrectly are obtained from the training samples based on the classification result. A part of outlier samples that are classified incorrectly is deleted from the training samples, and the remaining training samples are used as an optimal sample set. A second classification model is established based on the optimal sample set so as to perform a defect detection through the second classification model.