TRANSISTOR WITH SINGLE TERMINATION TRENCH HAVING DEPTH MORE THAN 10 MICRONS

In one aspect, a method of fabricating a transistor includes depositing a first epitaxial layer; depositing a second epitaxial layer on the first epitaxial layer; forming a single termination trench in the second epitaxial layer; and filling the termination trench with a dielectric. A depth of the t...

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Bibliographische Detailangaben
Hauptverfasser: Hoilien, Noel, West, Peter, Appat, Rajesh
Format: Patent
Sprache:eng
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Zusammenfassung:In one aspect, a method of fabricating a transistor includes depositing a first epitaxial layer; depositing a second epitaxial layer on the first epitaxial layer; forming a single termination trench in the second epitaxial layer; and filling the termination trench with a dielectric. A depth of the termination trench is greater than 10 microns. In another aspect, a transistor includes a first epitaxial layer; a second epitaxial layer on the first epitaxial layer; and a single termination trench in the second epitaxial layer. The termination trench is greater than 10 microns and is filled with a dielectric.