TEMPERATURE CONTROL SYSTEM

Provided is a temperature control system applied to an apparatus for analyzing a sample using a pipette nozzle and a reaction container, including a pipette tip temperature controller that heats a pipette tip which is fitted on the pipette nozzle and aspirates or discharges liquid and a reaction con...

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Bibliographische Detailangaben
Hauptverfasser:	TANAKA, Teiji, NODA, Tetsuya, FUJII, Hiromi, YAMAZAKI, Tatsuya, IWASHITA, Atsuo, NAKAGAWA, Tomoharu, SHOUJI, Yuuya
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Provided is a temperature control system applied to an apparatus for analyzing a sample using a pipette nozzle and a reaction container, including a pipette tip temperature controller that heats a pipette tip which is fitted on the pipette nozzle and aspirates or discharges liquid and a reaction container temperature controller that heats the reaction container. The pipette tip temperature controller heats, in a concentrated manner, at least a distal end portion of the pipette tip of the pipette nozzle located at a predetermined heating position with hot air emitted from a heat source and is configured such that a distal end is capable of arriving at the reaction container by lowering the pipette nozzle from the heating position.