PASSIVATION LAYER FOR PROTECTING SEMICONDUCTOR STRUCTURES

A method for making a semiconductor structure includes forming a first fin and a second fin over a substrate. The method includes forming one or more work function layers over the first and second fins. The method includes forming a nitride-based metal film over the one or more work function layers....

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Bibliographische Detailangaben
Hauptverfasser: Chuang, Ying-Liang, Hsu, Yao-Wen
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method for making a semiconductor structure includes forming a first fin and a second fin over a substrate. The method includes forming one or more work function layers over the first and second fins. The method includes forming a nitride-based metal film over the one or more work function layers. The method includes covering the first fin with a patternable layer. The method includes removing a second portion of the nitride-based metal film from the second fin, while leaving a first portion of the nitride-based metal film over the first fin substantially intact.