SEMICONDUCTOR DEVICE

In a semiconductor device according to the technology disclosed in the present specification, a temperature detection region is provided with a diffusion layer of a second conductivity type provided on a surface layer of a drift layer of a first conductivity type, a well layer of a first conductivit...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SONEDA, Shinya, FURUKAWA, Akihiko
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:In a semiconductor device according to the technology disclosed in the present specification, a temperature detection region is provided with a diffusion layer of a second conductivity type provided on a surface layer of a drift layer of a first conductivity type, a well layer of a first conductivity type provided on a surface layer of the diffusion layer and electrically connected to an anode electrode, and a cathode layer of a first conductivity type provided on a surface layer of the well layer and electrically connected to a cathode electrode.