MICROTEXTURE REGION CHARACTERIZATION SYSTEMS AND METHODS

The present disclosure provides methods and systems for the characterization of a potential microtexture region (MTR) of a sample, component, or the like. The methods may include determining a threshold width of spatial correlation coefficient and/or a threshold spatial correlation coefficient slope...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Barnard, Dan, Roberts, Ronald, Tian, Yong
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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