MICROTEXTURE REGION CHARACTERIZATION SYSTEMS AND METHODS

The present disclosure provides methods and systems for the characterization of a potential microtexture region (MTR) of a sample, component, or the like. The methods may include determining a threshold width of spatial correlation coefficient and/or a threshold spatial correlation coefficient slope...

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Bibliographische Detailangaben
Hauptverfasser:	Barnard, Dan, Roberts, Ronald, Tian, Yong
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present disclosure provides methods and systems for the characterization of a potential microtexture region (MTR) of a sample, component, or the like. The methods may include determining a threshold width of spatial correlation coefficient and/or a threshold spatial correlation coefficient slope for an actual MTR, characterizing a potential MTR as an actual MTR or a defect, characterizing an actual MTR as an acceptable MTR or not, and/or characterizing various components with potential MTRs as defective or not. The characterization may include calculating a width of spatial correlation coefficient and/or a spatial correlation coefficient slope of the potential MTR and comparing the width of spatial correlation coefficient to a threshold width of spatial correlation coefficient and/or comparing the spatial correlation coefficient slope to a threshold spatial correlation coefficient slope for the potential MTR to be characterized as an actual MTR or a defect (crack).