COMPILER-BASED CODE GENERATION FOR POST-SILICON VALIDATION

COMPILER-BASED CODE GENERATION FOR POST-SILICON VALIDATION

Embodiments relate to a system, program product, and method for integrating compiler-based testing in post-silicon validation. The method includes generating a test program through a device-under-test (DUT). The method also includes generating a plurality of memory intervals and injecting the plural...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Sokhin, Vitali, Ibraheem, Wesam Saleem, Aviv, Shay, Mendelson, Hillel, Kolan, Tom
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Embodiments relate to a system, program product, and method for integrating compiler-based testing in post-silicon validation. The method includes generating a test program through a device-under-test (DUT). The method also includes generating a plurality of memory intervals and injecting the plurality of memory intervals into the test program. The method further includes injecting a plurality of compiled test snippets into the test program and executing one or more post-silicon validation tests for the DUT with the test program.