CERAMIC COMPONENT AND PLASMA ETCHING APPARATUS COMPRISING SAME

A ceramic component included in a plasma etching apparatus, wherein a surface of the ceramic component may include a base material and a composite material disposed in contact with the base material, wherein a resistivity of the ceramic component may be 10−1 Ω·cm to 20 Ω·cm, and wherein the base mat...

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Bibliographische Detailangaben
Hauptverfasser: HAN, Younguk, OH, Junrok, KIM, Kyungin, HWANG, SungSic, MIN, Kyungyeol, KANG, Jungkun
Format: Patent
Sprache:eng
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Zusammenfassung:A ceramic component included in a plasma etching apparatus, wherein a surface of the ceramic component may include a base material and a composite material disposed in contact with the base material, wherein a resistivity of the ceramic component may be 10−1 Ω·cm to 20 Ω·cm, and wherein the base material may include a first boron carbide-based material and the composite material may include at least one selected from the group consisting of a second boron carbide-based material, a carbon-based material, and combinations thereof, is disclosed.