INTERCONNECT STRUCTURE WITH AIR-GAPS

The present disclosure, in some embodiments, relates to an integrated chip. The integrated chip includes a first interconnect arranged within an inter-level dielectric (ILD) layer. The first interconnect has opposing sidewalls that are both laterally separated from closest neighboring interconnects...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Yang, Tai-I, Chuang, Cheng-Chi, Wang, Yung-Chih, Lin, Tien-Lu
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present disclosure, in some embodiments, relates to an integrated chip. The integrated chip includes a first interconnect arranged within an inter-level dielectric (ILD) layer. The first interconnect has opposing sidewalls that are both laterally separated from closest neighboring interconnects within the ILD layer by one or more air-gaps along a cross-sectional view. A second interconnect is arranged within the ILD layer. The ILD layer laterally contacts opposing sidewalls of the second interconnect as viewed along the cross-sectional view.