MEASURING DEVICE

A measuring device includes first and second component groups rotatable about an axis relative to each other. The first component group has a scanning component, having a first substrate, and the second component group has a scale component, having a second substrate and an angle scale. The measurin...

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Bibliographische Detailangaben
Hauptverfasser:	TIEMANN, Marc Oliver, AUER, Daniel, HEINEMANN, Christoph
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A measuring device includes first and second component groups rotatable about an axis relative to each other. The first component group has a scanning component, having a first substrate, and the second component group has a scale component, having a second substrate and an angle scale. The measuring device can determine a relative angular position between the component groups. The measuring device has a passive sensor array having conductor track structures. The conductor track structures are applied on the first substrate by an additive process so that the sensor array determines a torsional load of the first substrate about the axis. Alternatively, the conductor track structures are applied on the second substrate by an additive process so that the sensor array determines a torsional load of the second substrate about the axis.