DATA ANALYZING APPARATUS, METHOD, AND PROGRAM

DATA ANALYZING APPARATUS, METHOD, AND PROGRAM

A data analysis apparatus according to the embodiment includes factor data collection means for collecting factor data assumed to affect to-be-predicted data serving as an objective variable; and generation means for calculating a corrected partial differential value of a change in a value of the fa...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: AZUMA, Shozo, INDO, Takuya, WATANABE, Tomoki, SATO, Tae, CHIBA, Akihiro
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
PHYSICS
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Beschreibung
Zusammenfassung:A data analysis apparatus according to the embodiment includes factor data collection means for collecting factor data assumed to affect to-be-predicted data serving as an objective variable; and generation means for calculating a corrected partial differential value of a change in a value of the factor data based on a degree of influence of a factor on the objective variable, which is a characteristic of the change in the value of the factor data, for each type of the factor data collected by the factor data collection means and generating an explanatory variable based on the corrected partial differential value.