AI-ACCELERATED CHARACTERIZATION OF MATERIALS

Devices, systems, and methods for material characterization can include detecting definitional data from material samples that are positionally encoded according to know attributes as operational data, characterizing at least some of the samples as training data, and processing the training data via...

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Hauptverfasser:	IVANKIN, Andrey, SWISHER, Jordan H, ASHLEY, Michael J
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING HANDLING RECORD CARRIERS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS TESTING
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creator	IVANKIN, Andrey SWISHER, Jordan H ASHLEY, Michael J
description	Devices, systems, and methods for material characterization can include detecting definitional data from material samples that are positionally encoded according to know attributes as operational data, characterizing at least some of the samples as training data, and processing the training data via a machine learning model to train the model and/or to characterize the remaining samples based on the training data.
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subjects	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING HANDLING RECORD CARRIERS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS TESTING
title	AI-ACCELERATED CHARACTERIZATION OF MATERIALS
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