AI-ACCELERATED CHARACTERIZATION OF MATERIALS

AI-ACCELERATED CHARACTERIZATION OF MATERIALS

Devices, systems, and methods for material characterization can include detecting definitional data from material samples that are positionally encoded according to know attributes as operational data, characterizing at least some of the samples as training data, and processing the training data via...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: IVANKIN, Andrey, SWISHER, Jordan H, ASHLEY, Michael J
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
HANDLING RECORD CARRIERS
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
PRESENTATION OF DATA
RECOGNITION OF DATA
RECORD CARRIERS
TESTING
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Beschreibung
Zusammenfassung:Devices, systems, and methods for material characterization can include detecting definitional data from material samples that are positionally encoded according to know attributes as operational data, characterizing at least some of the samples as training data, and processing the training data via a machine learning model to train the model and/or to characterize the remaining samples based on the training data.