SHADOW FEATURE-BASED DETERMINATION OF CAPACITANCE VALUES FOR INTEGRATED CIRCUIT (IC) LAYOUTS

A computing system may include a shadow feature model training engine configured to access a set of integrated circuit (IC) layouts and capacitance values determined for components of the set of IC layouts. The shadow feature model training engine may construct shadow feature training data for the set of IC layouts, including by extracting shadow features for components of the set of IC layouts, combine extracted shadow features and determined capacitance values to form the shadow feature training data, and may further train a machine-learning (ML) model with the shadow feature training data. The computing system may also include a shadow feature application engine configured to extract shadow features for components of an input IC layout and determine capacitance values for the input IC layout via the trained ML model.