RUTHENIUM ETCHING PROCESS

Embodiments of this disclosure provide methods for etching ruthenium. A halide-containing-gas is flowed into a substrate processing chamber, and then an oxygen-containing gas is flowed into the substrate processing chamber. The methods may include atomic layer etching (ALE). The methods may be condu...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Anthis, Jeffrey W, Kazem, Nasrin
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Embodiments of this disclosure provide methods for etching ruthenium. A halide-containing-gas is flowed into a substrate processing chamber, and then an oxygen-containing gas is flowed into the substrate processing chamber. The methods may include atomic layer etching (ALE). The methods may be conducted at higher processing chambers, permitting deposition and etching of ruthenium to be conducted in the same processing chamber.