METHOD FOR QUANTITATIVELY CHARACTERIZING DENDRITE SEGREGATION AND DENDRITE SPACING OF HIGH-TEMPERATURE ALLOY INGOT

A method for quantitatively characterizing a dendrite segregation and dendrite spacing of a high-temperature alloy ingot is disclosed. The method includes preparation and surface treatment of the high-temperature alloy ingot, selection of calibration sample and determination of an element content, e...

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Bibliographische Detailangaben
Hauptverfasser: LI, DONGLING, ZHAO, LEI, LIU, MINGBO, CAI, WENYI, WANG, HAIZHOU, PENG, YA, LIU, ZONGXIN, SHEN, XUEJING
Format: Patent
Sprache:eng
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Zusammenfassung:A method for quantitatively characterizing a dendrite segregation and dendrite spacing of a high-temperature alloy ingot is disclosed. The method includes preparation and surface treatment of the high-temperature alloy ingot, selection of calibration sample and determination of an element content, establishment of quantitative method for elements in micro-beam X-ray fluorescence spectrometer, quantitative distribution analysis of element components of the high-temperature alloy, quantitative characterization of characteristic element line distribution of high-temperature alloy, and analysis of a characteristic element line distribution map and statistics of a secondary dendrite spacing.