IMAGE SENSOR AND MANUFACTURING METHOD THEREOF

The present disclosure provides a semiconductor structure, including a substrate including a first material, wherein the first material generates electrical signals from radiation within a first range of wavelengths, an image sensor element including a second material, wherein the second material ge...

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Bibliographische Detailangaben
Hauptverfasser: JIANG, SIN-YI, LIAO, YIN-KAI, SZE, JHY-JYI, CHU, YI-SHIN, CHEN, HSIANG-LIN, HUANG, KUANIEH, LIN, JUNG-I
Format: Patent
Sprache:eng
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Zusammenfassung:The present disclosure provides a semiconductor structure, including a substrate including a first material, wherein the first material generates electrical signals from radiation within a first range of wavelengths, an image sensor element including a second material, wherein the second material generates electrical signals from radiation within a second range of wavelengths, the second range is different from first range, a transparent layer proximal to a light receiving surface of the image sensor element, wherein the transparent layer is transparent to radiation within the second range of wavelength, and an interconnect structure connected to a signal transmitting surface of the image sensor element.